Title :
Modeling ground signal probe invasiveness and its effect on extracted inductor Q
Author :
Godshalk, E. ; Sundberg, G.
Author_Institution :
Maxim Integrated Products, Seattle, WA, USA
Abstract :
The invasive nature of the ground-signal wafer probe is modeled and its effect on extracted inductor Q is investigated. Data is presented demonstrating that the extracted Q of surface mount (SMT) inductors is lower when measured with ground-signal (GS) versus ground-signal-ground (GSG) coaxial wafer probes. We believe that the degradation in Q is caused by a quasi-TEM mode that effectively adds resistive loss to the inductor. A simple circuit model is proposed which accounts for the interaction of this mode with the inductor.
Keywords :
inductors; probes; semiconductor device models; surface mount technology; ground-signal coaxial wafer probes; ground-signal-ground coaxial wafer probes; quasiTEM mode; resistive loss; surface mount inductors; Circuit testing; Coaxial cables; Coaxial components; Conducting materials; Data mining; Electrical resistance measurement; Inductors; Probes; Semiconductor device modeling; Surface-mount technology;
Conference_Titel :
ARFTG Conference Digest, Spring 2002. 59th
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-7143-7
DOI :
10.1109/ARFTGS.2002.1214683
