DocumentCode :
1686862
Title :
Design and measurement methodology for a sub-picoampere current digitiser
Author :
Voulgari, Evgenia ; Noy, Matthew ; Anghinolfi, Francis ; Krummenacher, Francois ; Kayal, Maher
Author_Institution :
CERN, Geneva, Switzerland
fYear :
2015
Firstpage :
525
Lastpage :
529
Abstract :
This paper introduces some design and measurement techniques that were used in the design and the testing of an ASIC for ultra-low current sensing. The idea behind this paper is to present the limitations in sub-picoampere current measurements and demonstrate an ASIC that can accurately measure the different sources of leakage currents and the methodology of measuring. Then the leakage current can be subtracted or compensated in order to accurately measure the ultra-low current that is generated from a sensor/detector. The proposed ASIC can measure currents as low as -50 fA, a value well below similar ASIC implementations.
Keywords :
analogue-digital conversion; application specific integrated circuits; integrated circuit design; integrated circuit measurement; leakage currents; ASIC; leakage currents; low current sensing; measurement techniques; subpicoampere current digitiser; Application specific integrated circuits; Current measurement; Detectors; Electrostatic discharges; Leakage currents; Subthreshold current; Temperature measurement; Ultra-low current sensing; leakage current; radiation detection; sub-picoampere current measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mixed Design of Integrated Circuits & Systems (MIXDES), 2015 22nd International Conference
Conference_Location :
Torun
Print_ISBN :
978-8-3635-7806-0
Type :
conf
DOI :
10.1109/MIXDES.2015.7208578
Filename :
7208578
Link To Document :
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