Title :
Reliability analysis using the ADEPT-REST interface
Author :
Rao, Ramesh ; Rahmam, A. ; Johnson, Barry W.
Author_Institution :
Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
Abstract :
The Advanced Design Environment Prototype Tool (ADEPT) brings dependability analysis and trade-offs into the mainstream of the design process. ADEPT models are constructed using a collection of predefined library elements, called ADEPT modules. Each ADEPT module has an unambiguous mathematical definition in the form of a colored Petri net (CPN) and a corresponding VHSIC (very high speed integrated circuit) hardware description language (VHDL) description. One of the key features of ADEPT is that the designer need deal with only one model of the system, the ADEPT model, from which alternate representations, for performance and dependability analysis, are derived using provably correct transformations. The use of a single model eliminates the problem of inconsistency between the different models used to perform system-level analysis and trade-offs. The ADEPT toolset supports several simulation and analytical based approaches to dependability analysis of ADEPT models. The focus of this paper is on describing an approach to integrating the ADEPT-VHDL simulation model and the Reliability Estimation System Testbed (REST) engine in order to estimate system reliability from ADEPT models. This paper presents an overview of the ADEPT methodology, the ADEPT-REST interface, and examples which illustrate the capabilities of the methodology
Keywords :
CAD; Markov processes; Petri nets; circuit reliability; circuit testing; hardware description languages; reliability theory; ADEPT-REST interface; Advanced Design Environment Prototype Tool; CAD; Markov model; Reliability Estimation System Testbed; VHDL; VHSIC hardware description language; colored Petri net; dependability analysis; digital electronic systems design; integrated design environment; performance analysis; predefined library elements; reliability modelling; very high speed integrated circuit; Analytical models; Engines; Hardware design languages; Libraries; Performance analysis; Process design; Prototypes; Reliability; System testing; Very high speed integrated circuits;
Conference_Titel :
Reliability and Maintainability Symposium, 1996 Proceedings. International Symposium on Product Quality and Integrity., Annual
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-3112-5
DOI :
10.1109/RAMS.1996.500645