DocumentCode :
1686919
Title :
An alternative method of analyzing multi-stress multi-level life and accelerated life tests
Author :
Dietrich, Duane L. ; Mazzuchi, Thomas A.
Author_Institution :
Dept. of Syst. & Ind. Eng., Arizona Univ., Tucson, AZ, USA
fYear :
1996
Firstpage :
90
Lastpage :
96
Abstract :
In the study of life testing, it has been shown that multiple stresses and multiple stress levels are important features to exploit for better inference. In addition, the incorporating of design of experiments concepts in multi-level, multi-stress life and accelerated life tests is more frequently being advocated in the military-industrial community. The benefits of efficient testing by fractional factorial designs and the ability to estimate the effects of the stresses and their possible interactions, provides reason to investigate the combination of design of experiment techniques with multi-stress testing. However, the need for an analysis method that requires neither the 3 or 4 replications of each test cell nor the calculation of pseudo cell MTTFs, is both necessary and obvious. In this paper, some statistical problems that occur in the use of standard ANOVA and regression analysis technique for the analysis of these type of test results are identified. In addressing these problems, an alternative Bayesian analysis procedure is proposed
Keywords :
Bayes methods; design of experiments; life testing; reliability theory; statistical analysis; Bayesian analysis procedure; accelerated life tests; design of experiments; fractional factorial designs; industrial community; military community; multi-stress multi-level life testing; ordered Dirichlet distribution; regression analysis technique; standard ANOVA technique; statistical problems; Analysis of variance; Bayesian methods; Design for experiments; Life estimation; Life testing; Regression analysis; Stress; System testing; Temperature; US Department of Energy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability and Maintainability Symposium, 1996 Proceedings. International Symposium on Product Quality and Integrity., Annual
Conference_Location :
Las Vegas, NV
ISSN :
0149-144X
Print_ISBN :
0-7803-3112-5
Type :
conf
DOI :
10.1109/RAMS.1996.500647
Filename :
500647
Link To Document :
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