• DocumentCode
    1687046
  • Title

    Detection of Anomalies in Textures Based on Multi-Resolution Features

  • Author

    Shadhan, Lior ; Cohen, Israel

  • Author_Institution
    Department of Electrical Engineering, Technion - Israel Institute of Technology, Technion City, Haifa 32000, Israel. shadhan@tx.technion.ac.il
  • fYear
    2006
  • Firstpage
    354
  • Lastpage
    358
  • Abstract
    Multi-resolution decompositions, such as the wavelet transform, are often employed in anomaly detection algorithms for feature extraction. However, the extracted features may be unreliable for anomaly detection in textures due to inconsistencies between the assumed background model and the true data. In this paper, we present an anomaly detection scheme which relies on a statistical model of textures and is specifically designed for detection of anomalies in textures. Motivated by recent works on texture segmentation and texture classification, we introduce a multi-resolution feature space that facilitates anomaly detection with constant false alarm rate for a wide range of textures. Experimental results demonstrate that the proposed algorithm, when applied to images containing background texture, achieves improved detection results and lower false alarm rate than a competitive anomaly detection scheme.
  • Keywords
    Bayesian methods; Detectors; Discrete wavelet transforms; Extraterrestrial phenomena; Feature extraction; GSM; Layout; Multiresolution analysis; Statistics; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Electronics Engineers in Israel, 2006 IEEE 24th Convention of
  • Conference_Location
    Eilat, Israel
  • Print_ISBN
    1-4244-0229-8
  • Electronic_ISBN
    1-4244-0230-1
  • Type

    conf

  • DOI
    10.1109/EEEI.2006.321102
  • Filename
    4115310