Title :
Detection of Anomalies in Textures Based on Multi-Resolution Features
Author :
Shadhan, Lior ; Cohen, Israel
Author_Institution :
Department of Electrical Engineering, Technion - Israel Institute of Technology, Technion City, Haifa 32000, Israel. shadhan@tx.technion.ac.il
Abstract :
Multi-resolution decompositions, such as the wavelet transform, are often employed in anomaly detection algorithms for feature extraction. However, the extracted features may be unreliable for anomaly detection in textures due to inconsistencies between the assumed background model and the true data. In this paper, we present an anomaly detection scheme which relies on a statistical model of textures and is specifically designed for detection of anomalies in textures. Motivated by recent works on texture segmentation and texture classification, we introduce a multi-resolution feature space that facilitates anomaly detection with constant false alarm rate for a wide range of textures. Experimental results demonstrate that the proposed algorithm, when applied to images containing background texture, achieves improved detection results and lower false alarm rate than a competitive anomaly detection scheme.
Keywords :
Bayesian methods; Detectors; Discrete wavelet transforms; Extraterrestrial phenomena; Feature extraction; GSM; Layout; Multiresolution analysis; Statistics; Wavelet transforms;
Conference_Titel :
Electrical and Electronics Engineers in Israel, 2006 IEEE 24th Convention of
Conference_Location :
Eilat, Israel
Print_ISBN :
1-4244-0229-8
Electronic_ISBN :
1-4244-0230-1
DOI :
10.1109/EEEI.2006.321102