Title :
Proposal of a universal test scene for depth map evaluation
Author :
Andorko, I. ; Corcoran, Peter ; Bigioi, P.
Author_Institution :
Coll. of Eng. & Inf., Nat. Univ. of Ireland, Galway, Ireland
Abstract :
Nowadays, a large number of depth map generation methods use additional devices, for example Infra-Red (IR) sensors, Time of Flight (ToF) cameras, etc. One of the disadvantages of these methods is, that they cannot use test images like the ones from the Middlebury database [1] to test their accuracy, for obvious reasons. We are planning to propose a universal test scene, which can be re-created by any researcher by providing a selection of universally accessible objects, scene layout measurements and test environment conditions such as light intensity and temperature.
Keywords :
image processing; IR sensor; Middlebury database; ToF camera; depth map evaluation; depth map generation method; image processing; infrared sensor; light intensity condition; scene layout measurement; temperature condition; time-of-flight camera; universal test scene; universally accessible object selection; Cameras; Conferences; Databases; Image color analysis; Sensors; Temperature measurement;
Conference_Titel :
Consumer Electronics (ICCE), 2013 IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4673-1361-2
DOI :
10.1109/ICCE.2013.6486836