DocumentCode :
1687104
Title :
A Multi-scale Piecewise-Linear Feature Detector for Spectrogram Tracks
Author :
Lampert, Thomas A. ; Pears, Nick E. ; O´Keefe, Simon E M
Author_Institution :
Dept. of Comput. Sci., Univ. of York, York, UK
fYear :
2009
Firstpage :
330
Lastpage :
335
Abstract :
Reliable feature detection is a prerequisite to higher level decisions regarding image content. In the domain of spectrogram track detection and classification, the detection problem is compounded by low signal-to-noise ratios and high variation in track appearance. Evaluation of standard feature detection methods in the literature is essential to determine their strengths and weaknesses in this domain. With this knowledge, improved detection strategies can be developed. This paper presents a comparison of line detectors and a novel, multi-scale, linear feature detector able to detect tracks of varying gradients. We outline improvements to the multi-scale search strategies which reduce run-time costs. It is shown that the Equal Error Rates of existing methods are high, highlighting the need for research into novel detectors. Results demonstrate that the proposed method offers an improvement in detection rates when compared to other, state of the art, methods whilst keeping false positive rates low. It is also shown that a multi-scale implementation offers an improvement over fixed scale implementations.
Keywords :
error statistics; feature extraction; pattern classification; piecewise linear techniques; equal error rates; image content; multiscale piecewise-linear feature detector; spectrogram track classification; spectrogram track detection; Acoustic signal detection; Computer science; Computer vision; Detectors; Frequency; Piecewise linear techniques; Principal component analysis; Sonar detection; Spectrogram; Underwater tracking; Feature Detector; Line Detection; Parametric; Spectrogram; Track Detection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Video and Signal Based Surveillance, 2009. AVSS '09. Sixth IEEE International Conference on
Conference_Location :
Genova
Print_ISBN :
978-1-4244-4755-8
Electronic_ISBN :
978-0-7695-3718-4
Type :
conf
DOI :
10.1109/AVSS.2009.84
Filename :
5279751
Link To Document :
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