Title :
Weighted Sum Rate Optimization of Multicell Cognitive Radio Networks
Author :
Ma, Yao ; Kim, Dong In ; Leith, Alex
Author_Institution :
Dept. of ECE, Iowa State Univ., IA
Abstract :
In this paper, we study the weighted sum rate maximization of multicell cellular cognitive radio networks (CRNs) which are overlaid with multicell primary radio networks (PRNs). We assume each CRN cell is collocated with a PRN cell and has a cellular structure with access point (AP) and multiple secondary users (SUs). We propose a unified framework to determine the operation parameters of the CRNs in the multicell environment. First, to avoid unacceptable interference to primary users (PUs), we propose methods to determine the power spectral masks (PSMs) of SUs and APs in uplink and downlink transmissions at each subchannel based on the target signal-to-interference-plus-noise ratio (SINR) outage probability of PRN base station (BS) receivers. Second, we utilize the duality optimization tool and design weighted sum rate maximization schemes which include the PSM optimally. Third, we accurately model the intercell interferences between CRNs and mutual interferences between the PRNs and CRNs, as a function of multiple system parameters. Our model and approaches provide powerful design tools and deep insights into achievable performance for overlaid CRNs and PRNs.
Keywords :
cellular radio; cognitive radio; optimisation; probability; radio links; access point; base station receivers; downlink transmissions; duality optimization tool; multicell cellular cognitive radio networks; multicell primary radio networks; power spectral masks; primary users; secondary users; signal-to-interference-plus-noise ratio outage probability; uplink transmissions; weighted sum rate maximization; Base stations; Cells (biology); Cellular networks; Cognitive radio; Design optimization; Downlink; Interference; Power system modeling; Radio network; Signal to noise ratio;
Conference_Titel :
Global Telecommunications Conference, 2008. IEEE GLOBECOM 2008. IEEE
Conference_Location :
New Orleans, LO
Print_ISBN :
978-1-4244-2324-8
DOI :
10.1109/GLOCOM.2008.ECP.870