Title :
Continuous state reliability analysis
Author :
Yang, Kai ; Xue, Jianan
Author_Institution :
Dept. of Ind. & Manuf. Eng., Wayne State Univ., Detroit, MI, USA
Abstract :
In this paper, the authors extend binary state reliability analysis to continuous state reliability analysis. This extension enables the analysis of both catastrophic failure and performance degradation simultaneously. The modeling of degradation is based on an independent increment random process or a normal random process. Regression analysis is used to estimate degradation parameters. The state tree method is introduced to conduct system reliability analysis for both degradation and catastrophic failures. ANOVA and DOE techniques are used to assess the criticality of product parameters or components to performance degradation
Keywords :
fault trees; reliability theory; statistical analysis; ANOVA technique; DOE technique; binary state reliability analysis; catastrophic failure; continuous state reliability analysis; degradation modelling; independent increment random process; normal random process; performance degradation; regression analysis; state tree method; Analysis of variance; Degradation; Failure analysis; Independent component analysis; Parameter estimation; Performance analysis; Random processes; Regression analysis; Reliability; US Department of Energy;
Conference_Titel :
Reliability and Maintainability Symposium, 1996 Proceedings. International Symposium on Product Quality and Integrity., Annual
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-3112-5
DOI :
10.1109/RAMS.1996.500670