Title :
Measuring power and temperature from real processors
Author :
Mesa-Martinez, Francisco J. ; Brown, Michael ; Nayfach-Battilana, Joseph ; Renau, Jose
Author_Institution :
Dept. of Comput. Eng., Univ. of California, Santa Cruz, CA
Abstract :
The modeling of power and thermal behavior of modern processors requires challenging validation approaches, which may be complex and in some cases unreliable. In order to address some of the difficulties associated with the validation of power and thermal models, this document describes an infrared measurement setup that simultaneously captures run-time power consumption and thermal characteristics of a processor. We use infrared cameras with high spatial resolution (10 x 10 mum) and high frame rate (125 Hz) to capture thermal maps. Power measurements are obtained with a multimeter at a sampling rate of 1 K Hz. The synchronized traces can then be used in the validation process of possible thermal and power processor activity models.
Keywords :
infrared imaging; microprocessor chips; power aware computing; power measurement; temperature measurement; infrared cameras; infrared measurement; power measurement; power processor activity models; run-time power consumption; temperature measurement; thermal behavior; Cameras; Counting circuits; Energy consumption; Power engineering and energy; Power engineering computing; Power measurement; Power system modeling; Semiconductor device measurement; Statistics; Temperature measurement;
Conference_Titel :
Parallel and Distributed Processing, 2008. IPDPS 2008. IEEE International Symposium on
Conference_Location :
Miami, FL
Print_ISBN :
978-1-4244-1693-6
Electronic_ISBN :
1530-2075
DOI :
10.1109/IPDPS.2008.4536423