Modelling of multilayer-dielectric-multilayer amplifying Fabry-Perot microinterferometer using the method of single expression

Author

Baghdasaryan, Hovik V. ; Knyazyan, Tamara M. ; Dashyan, Sergey G. ; Mankulov, Albert A. ; Uzunoglu, Nikalaos K.

Author_Institution

Fiber Opt. Commun. Lab., State Eng. Univ. of Armenia, Yerevan, Armenia

Volume

2

fYear

2002

fDate

6/24/1905 12:00:00 AM

Firstpage

53

Abstract

For multilayer-dielectric-multilayer (MDM) amplifying Fabry-Perot microinterferometer analysis an advanced method of single expression (MSE) is applied. The distinctive feature of the method is a presentation of the Helmholtz´s equation solution in each layer of a structure in the special form of a single expression. The electrodynamical problem of plane wave interaction with MDM Fabry-Perot structure is solved. The electric field amplitude distribution within and outside of the structure is obtained. The field localization at the resonance state is observed. Including amplification in the dielectric space between multilayer mirrors brings to the transformation of the microinterferometer´s transmission peaks to the amplified ones.

Keywords

Fabry-Perot interferometers; Helmholtz equations; electromagnetic field theory; micro-optics; optical multilayers; Helmholtz´s equation; MDM Fabry-Perot structure; dielectric space; electric field amplitude; electrodynamical problem; field localization; method of single expression; multilayer mirrors; multilayer-dielectric-multilayer amplifying Fabry-Perot microinterferometer; plane wave interaction; resonance state; transmission peaks; Coatings; Dielectric devices; Dielectric losses; Differential equations; Electromagnetic scattering; Fabry-Perot interferometers; Mirrors; Nonhomogeneous media; Nonlinear equations; Permittivity;

fLanguage

English

Publisher

ieee

Conference_Titel

Transparent Optical Networks, 2002. Proceedings of the 2002 4th International Conference on

Print_ISBN

0-7803-7375-8

Type

conf

DOI

10.1109/ICTON.2002.1007848

Filename

1007848