DocumentCode
1687936
Title
Novel maximum power point tracking strategy for photovoltaic system under partially shaded condition based Monte Carlo algorithm
Author
Lei Tang ; Wei Xu ; Jian Xun Jin
Author_Institution
Sch. of Electr. Eng. & Inf., Sichuan Univ., Chengdu, China
fYear
2013
Firstpage
285
Lastpage
286
Abstract
In this paper, a novel algorithm based on probability statistics and Monte Carlo method (MCM) is presented, which can be used to track the global power peak online, especially for partially shaded conditions. For this method, a probabilistic model with uniformly distributed random points should be constructed firstly for solar generation system, and MCM is used to predict the maximum power point (MPP). Next, single-peak method is used to obtain higher accuracy. By the new maximum power tracking (MPPT) approach, it is possible to track MPP without getting information of insolation. Besides, the convergence speed is independent of multiple peaks of photovoltaic (PV) traits. At last, a micro controller unit is needed. Plenty of simulations and experiments illustrate that the new strategy is reliable under complex irradiance conditions.
Keywords
Monte Carlo methods; maximum power point trackers; microcontrollers; photovoltaic power systems; solar power stations; MCM; MPP prediction; MPPT approach; Monte Carlo algorithm; complex irradiance condition; convergence speed; global power peak online; maximum power point tracking strategy; microcontroller unit; partially-shaded condition; photovoltaic system; photovoltaic trait; probabilistic model; probability statistics; single-peak method; solar generation system; uniformly-distributed random points; Accuracy; Educational institutions; Maximum power point trackers; Monte Carlo methods; Photovoltaic systems; Pulse width modulation; Silicon; Monte Carlo method (MCM); maximum power point tracking (MPPT); photovoltaic (PV);
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Superconductivity and Electromagnetic Devices (ASEMD), 2013 IEEE International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4799-0068-8
Type
conf
DOI
10.1109/ASEMD.2013.6780776
Filename
6780776
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