Title :
Guaranteed Locally-Stable Macromodels of Digital Devices via Echo State Networks
Author :
Stievano, L.S. ; Siviero, C. ; Maio, I.A. ; Canavero, F.G.
Author_Institution :
Dept. Elettronica, Politecnico di Torino
Abstract :
The assessment of signal integrity effects in high-speed digital systems requires accurate and efficient IC macromodels. The proposed methodology is based on parametric relations that are expressed in terms of discrete-time echo state networks. This approach overcomes the stability limitations of traditional parametric macromodels used so far. Applications of echo state networks to the modeling of real devices exhibiting a complex dynamical behavior are discussed
Keywords :
circuit stability; digital integrated circuits; discrete time systems; integrated circuit modelling; digital devices; echo state networks; high speed digital systems; locally stable macromodels; parametric relations; signal integrity effects; Digital integrated circuits; Digital systems; Electronics packaging; Equivalent circuits; High speed integrated circuits; Integrated circuit modeling; Numerical simulation; Parameter estimation; Stability; Voltage;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2006 IEEE
Conference_Location :
Scottsdale, AZ
Print_ISBN :
1-4244-0668-4
DOI :
10.1109/EPEP.2006.321192
