• DocumentCode
    1688093
  • Title

    S-parameters Based Transmission Line Modeling with Accurate Low-Frequency Response

  • Author

    Kim, Woopoung ; Kim, Joong-Ho ; Oh, Dan ; Yuan, Chuck

  • Author_Institution
    Rambus Inc., Los Altos, CA
  • fYear
    2006
  • Firstpage
    79
  • Lastpage
    82
  • Abstract
    Accurate transmission line modeling is required for multi-gigahertz designs. To capture high frequency effects such as frequency-dependent dielectric and conductor loss, S-parameters obtained from VNA measurement are commonly used to model transmission lines. Unfortunately, such method has not been very robust since the S-parameters from VNA measurement have a low frequency limit. In this paper, we present a method to obtain a broadband transmission line model with accurate low-frequency response. A conversion formale from the S-parameters to RLGC models is first derived for multi-conductor transmission lines. We then demonstrate the inaccuracy in transient waveforms of transmission line models due to inaccurate low frequency response. Finally we present a method to calculate the accurate low-frequency response using TDR time-domain measurements in addition to VNA frequency domain measurements
  • Keywords
    S-parameters; broadband networks; multiconductor transmission lines; time-varying networks; RLGC models; S-parameters; VNA frequency domain measurements; broadband transmission line model; low frequency response; multi conductor transmission lines; multi gigahertz designs; time domain measurements; transient waveforms; Conductors; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Frequency measurement; Multiconductor transmission lines; Propagation losses; Scattering parameters; Transmission line measurements; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2006 IEEE
  • Conference_Location
    Scottsdale, AZ
  • Print_ISBN
    1-4244-0668-4
  • Type

    conf

  • DOI
    10.1109/EPEP.2006.321196
  • Filename
    4115356