• DocumentCode
    1688765
  • Title

    Multiple Edge Responses for Fast and Accurate System Simulations

  • Author

    Oh, Dan

  • Author_Institution
    Rambus Inc., Los Altos, CA
  • fYear
    2006
  • Firstpage
    163
  • Lastpage
    166
  • Abstract
    Fast and accurate simulation of the system response is important in high-speed I/O system design because performance is severely limited by channel ISI and random noise. This paper presents a novel way to simulate the signal response given an arbitrary bit pattern using multiple edge responses (MER). The presented method provides an accuracy improvement over the traditional approaches which either uses the superposition of single bit response (SBR) or double edge response (DER), while maintaining the equivalent numerical efficiency
  • Keywords
    error statistics; high-speed integrated circuits; intersymbol interference; random noise; accurate system simulations; arbitrary bit pattern; channel ISI; double edge response; fast system simulations; high-speed I/O system design; multiple edge response; random noise; signal response; single bit response; Bit error rate; Circuit noise; Circuit simulation; Communication system signaling; Computational modeling; Density estimation robust algorithm; Electronics packaging; Impedance; Intersymbol interference; Probability distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic Packaging, 2006 IEEE
  • Conference_Location
    Scottsdale, AZ
  • Print_ISBN
    1-4244-0668-4
  • Type

    conf

  • DOI
    10.1109/EPEP.2006.321218
  • Filename
    4115378