DocumentCode
1689016
Title
Three-Transistor DRAM-Based Content Addressable Memory Design for Reliability and Area Efficiency
Author
Hsu, Wei-Ning ; Wu, Tsu-Hsin ; Huang, Tsung-Chu
Author_Institution
Dept. of Electron. Eng., Nat. Changhua Univ. of Educ., Changhua, Taiwan
fYear
2009
Firstpage
38
Lastpage
43
Abstract
Content addressable memory is widely used in communication network, inference machine and cache system. In this paper a three-transistor DRAM-based content ad-dressable memory cell design is proposed based on the Berger and m-out-of-n codes. The coding cannot only approve to reduce the redundant transistors but also provide a totally self-check for refresh and error detection mechanism for reliability. A novel Berger invert code is presented for improve the dependability for about 21% and information energy for 25%. From a variety of post-layout SPICE simulations, the search-match delay time cab be controlled under typical DRAM-based CAM level and the area efficient can be improved by almost double.
Keywords
DRAM chips; SPICE; content-addressable storage; error detection codes; integrated circuit reliability; Berger codes; cache system; communication network; error detection mechanism; inference machine; m-out-of-n codes; post-layout SPICE simulation; reliability; search-match delay time; three-transistor DRAM-based content addressable memory design; Associative memory; CADCAM; Computer aided manufacturing; Conferences; Educational technology; Electronic equipment testing; Encoding; Error correction codes; Telecommunication network reliability; Transistors; Berger Code; Content-Addressable Memory; DRAM; Equal-Weight Code; m-out-of-n Code;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design, and Testing, 2009. MTDT '09. IEEE International Workshop on
Conference_Location
Hsinchu
Print_ISBN
978-0-7695-3797-9
Type
conf
DOI
10.1109/MTDT.2009.17
Filename
5279829
Link To Document