DocumentCode :
1689016
Title :
Three-Transistor DRAM-Based Content Addressable Memory Design for Reliability and Area Efficiency
Author :
Hsu, Wei-Ning ; Wu, Tsu-Hsin ; Huang, Tsung-Chu
Author_Institution :
Dept. of Electron. Eng., Nat. Changhua Univ. of Educ., Changhua, Taiwan
fYear :
2009
Firstpage :
38
Lastpage :
43
Abstract :
Content addressable memory is widely used in communication network, inference machine and cache system. In this paper a three-transistor DRAM-based content ad-dressable memory cell design is proposed based on the Berger and m-out-of-n codes. The coding cannot only approve to reduce the redundant transistors but also provide a totally self-check for refresh and error detection mechanism for reliability. A novel Berger invert code is presented for improve the dependability for about 21% and information energy for 25%. From a variety of post-layout SPICE simulations, the search-match delay time cab be controlled under typical DRAM-based CAM level and the area efficient can be improved by almost double.
Keywords :
DRAM chips; SPICE; content-addressable storage; error detection codes; integrated circuit reliability; Berger codes; cache system; communication network; error detection mechanism; inference machine; m-out-of-n codes; post-layout SPICE simulation; reliability; search-match delay time; three-transistor DRAM-based content addressable memory design; Associative memory; CADCAM; Computer aided manufacturing; Conferences; Educational technology; Electronic equipment testing; Encoding; Error correction codes; Telecommunication network reliability; Transistors; Berger Code; Content-Addressable Memory; DRAM; Equal-Weight Code; m-out-of-n Code;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Memory Technology, Design, and Testing, 2009. MTDT '09. IEEE International Workshop on
Conference_Location :
Hsinchu
Print_ISBN :
978-0-7695-3797-9
Type :
conf
DOI :
10.1109/MTDT.2009.17
Filename :
5279829
Link To Document :
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