Title :
Characterization of Josephson tunneling junction by lifetime of zero-voltage state and fiske self-resonant step
Author :
Hao Li ; Gang Li ; Jian She Liu ; Tie Fu Li ; Wei Chen
Author_Institution :
Dept. of Microelectron. & Nanoelectron., Tsinghua Univ., Beijing, China
Abstract :
We fabricated high quality Josephson tunneling junctions by self-aligned lift-off process. Parameters including its critical current, normal resistance and capacitance which determine the dynamic energy consumption and speed of the superconducting electronics had been measured. The critical current of a 22 × 22 μm2 Junction is 1796 ± 52 μA calculated from the dependent curve between the lifetime of zero-voltage and switching current. The junction capacitance is 24.7 ± 3.9 pF obtained by observing Fiske self-resonant step when applied several Gauss magnetic field.
Keywords :
Josephson effect; capacitance; critical currents; superconducting junction devices; Fiske self-resonant step; Gauss magnetic field; Josephson tunneling junction; critical current; dynamic energy consumption; junction capacitance; normal resistance; self-aligned lift-off process; superconducting electronics; switching current; zero-voltage state lifetime; Capacitance; Current measurement; Josephson junctions; Junctions; Niobium; Temperature measurement; Tunneling; critical current; fiske self-resonant step; josephson tunneling junction; specific capacitance;
Conference_Titel :
Applied Superconductivity and Electromagnetic Devices (ASEMD), 2013 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-0068-8
DOI :
10.1109/ASEMD.2013.6780835
