• DocumentCode
    1689587
  • Title

    Voltage-Driven Multilevel Programming in Phase Change Memories

  • Author

    Cabrini, A. ; Braga, S. ; Manetto, A. ; Torelli, G.

  • Author_Institution
    Dept. of Electron., Univ. of Pavia, Pavia, Italy
  • fYear
    2009
  • Firstpage
    3
  • Lastpage
    6
  • Abstract
    In the multilevel (ML) storage approach, any single cell in a memory array is programmed to one among n>2 predetermined different states. To exploit the ML approach in the case of phase change memories (PCMs), it is necessary to accurately program the active chalcogenide layer to a number of different partially crystallized states so as to precisely allocate the electrical resistance of the cell in the range from the maximum to the minimum available value. In this paper, we experimentally investigate the characteristics of two voltage-driven programming algorithms, namely, the single-pulse and the (multi-pulse) staircase-up (SCU) programming algorithm, from a ML storage point of view. To this end, we analyze the impact of the amplitude and the time length of applied voltage pulses on the programmed resistance, showing that the SCU algorithm appears to be a promising candidate for PCM ML storage.
  • Keywords
    MOS memory circuits; chalcogenide glasses; phase change memories; MOSFET-selected PCM experimental chip; SCU algorithm; active chalcogenide layer; electrical resistance; memory array; multilevel storage; partially crystallized states; phase change memories; programmed resistance; staircase-up programming algorithm; voltage-driven multilevel programming; voltage-driven programming algorithms; Amorphous materials; Crystallization; Electric resistance; Electronic equipment testing; MOSFETs; Phase change materials; Phase change memory; Phased arrays; Temperature; Voltage; multilevel programming; phase change memories; voltage-driven programming;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design, and Testing, 2009. MTDT '09. IEEE International Workshop on
  • Conference_Location
    Hsinchu
  • Print_ISBN
    978-0-7695-3797-9
  • Type

    conf

  • DOI
    10.1109/MTDT.2009.11
  • Filename
    5279852