Title :
Pressure and temperature measurements with a dual-luminophor coating
Author :
Carroll, Bruce F. ; Hubner, James P. ; Schanze, Kirk ; Bedlek, Joanne ; Morris, Martin
Author_Institution :
Dept. of Aerosp. Eng., Mech. & Eng. Sci., Florida Univ., Gainesville, FL, USA
fDate :
6/21/1905 12:00:00 AM
Abstract :
Data reduction requirements for dual-luminophor pressure/temperature sensitive paints (P/TSP) are explored through the use of principal component analysis. The dual-luminophor coating contains one luminophor which primarily responds to temperature and one which responds to both temperature and pressure. The analysis indicates that a two-factor reduced order model based on two fundamental spectra represents the majority of the luminescence response but cannot properly account for mutual interaction effects between the luminophors. The inclusion of a third factor appears to sufficiently model the mutual interaction effects. This work indicates that P/TSP data reduction procedures based on principal component analysis are promising for improving the accuracy of the measurements. The potential to remove the requirement of a wind-off reference image and to reject high frequency noise is also indicated
Keywords :
aircraft testing; data reduction; photoluminescence; pressure measurement; pressure sensors; principal component analysis; radiation quenching; temperature measurement; temperature sensors; wind tunnels; data reduction requirements; dual-luminophor coating; high frequency noise rejection; luminescence response; measurement accuracy; mutual interaction effects; oxygen quenching; pressure measurement; pressure/temperature sensitive paint; principal component analysis; temperature measurement; two-factor reduced order model; wind tunnel testing; Coatings; Data engineering; Kirk field collapse effect; Luminescence; Paints; Pressure measurement; Principal component analysis; Temperature dependence; Temperature measurement; Temperature sensors;
Conference_Titel :
Instrumentation in Aerospace Simulation Facilities, 1999. ICIASF 99. 18th International Congress on
Conference_Location :
Toulouse
Print_ISBN :
0-7803-5715-9
DOI :
10.1109/ICIASF.1999.827158