DocumentCode
1689613
Title
Foreword
fYear
2009
Abstract
Presents the welcome message from the conference proceedings.
Keywords
Application specific processors; Circuit synthesis; Circuit testing; Investments; Loans and mortgages; Paper technology; Random access memory; Semiconductor memory; Speech; Tsunami;
fLanguage
English
Publisher
ieee
Conference_Titel
Memory Technology, Design, and Testing, 2009. MTDT '09. IEEE International Workshop on
Conference_Location
Hsinchu
Print_ISBN
978-0-7695-3797-9
Type
conf
DOI
10.1109/MTDT.2009.5
Filename
5279853
Link To Document