• DocumentCode
    1689668
  • Title

    Improved automatic target recognition using singular value decomposition

  • Author

    Bhatnagar, Vijay ; Shaw, Arnab K. ; Williams, Rob W.

  • Author_Institution
    Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA
  • Volume
    5
  • fYear
    1998
  • Firstpage
    2717
  • Abstract
    A new algorithm is presented for automatic target recognition (ATR) where the templates are obtained via singular value decomposition (SVD) of high range resolution (HRR) profiles. SVD analysis of a large class of HRR data reveals that the range-space eigenvectors corresponding to the largest singular value accounts for more than 90% of the target energy. Hence, it is proposed that the range-space eigenvectors be used as templates for classification. The effectiveness of data normalization and Gaussianization of profile data for improved classification performance is also studied. With extensive simulation studies it is shown that the proposed eigen-template based ATR approach provides consistent superior performance with the recognition rate reaching 99.5% for the four class XPATCH database
  • Keywords
    Gaussian processes; eigenvalues and eigenfunctions; image classification; image resolution; radar imaging; radar target recognition; singular value decomposition; synthetic aperture radar; Gaussian profile data; SAR; SVD; algorithm; automatic target recognition; classification performance; data normalization; four class XPATCH database; ground targets imaging; high range resolution profiles; moving target indicator; range-space eigenvectors; recognition rate; simulation studies; singular value decomposition; synthetic aperture radar; target energy; Energy resolution; Gaussian processes; Image databases; Laboratories; Object detection; Singular value decomposition; Surveillance; Synthetic aperture radar; Target recognition; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech and Signal Processing, 1998. Proceedings of the 1998 IEEE International Conference on
  • Conference_Location
    Seattle, WA
  • ISSN
    1520-6149
  • Print_ISBN
    0-7803-4428-6
  • Type

    conf

  • DOI
    10.1109/ICASSP.1998.678084
  • Filename
    678084