Title :
An EM Algorithm for Path Delay and Complex Gain Estimation of Slowly Varying Fading Channel for CPM Signals
Author :
Abeida, H. ; Brossier, J.-M. ; Ros, L. ; Vilà-Valls, J.
Author_Institution :
GIPSA-Lab.\\DIS, St. Martin d´´Heres, France
Abstract :
This paper addresses the joint path delay and time-varying complex gain estimation for continuous phase modulation (CPM) over a time-selective slowly varying flat Rayleigh fading channel. We propose an expectation-maximization (EM) algorithm for path delay estimation in a Kalman smoother framework. The time-varying complex gain is modeled by a first order autoregressive (AR) process. Such a modeling yields to the representation of the problem by a dynamic Bayesian system in a state-space form that allows the application of EM algorithm in the context of unobserved data for obtaining an estimate of the path delay. This is used with Kalman smoother for state estimation. We derive analytically a closed-form expression of the modified hybrid Cramer-Rao bound (MHCRB) for path delay and complex gain parameters. Finally, some numerical examples are presented to illustrate the performance of the proposed algorithm compared to the conventional generalized correlation method and to the MHCRB.
Keywords :
Bayes methods; Rayleigh channels; autoregressive processes; expectation-maximisation algorithm; phase modulation; Cramer-Rao bound; Kalman smoother framework; closed-form expression; continuous phase modulation; dynamic Bayesian system; expectation-maximization algorithm; first order autoregressive process; flat Rayleigh fading channel; path delay estimation; slowly varying Rayleigh fading channel; slowly varying fading channel; state-space form; time selective Rayleigh fading channel; time-varying complex gain estimation; Bayesian methods; Closed-form solution; Context modeling; Continuous phase modulation; Delay estimation; Fading; Kalman filters; Phase estimation; State estimation; Yield estimation;
Conference_Titel :
Global Telecommunications Conference, 2009. GLOBECOM 2009. IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-4148-8
DOI :
10.1109/GLOCOM.2009.5425719