[Title page i]

fYear

2009

Abstract

The following topics are dealt with: dependence analysis; code tracing; reverse engineering; and analysis framework.

Keywords

program diagnostics; reverse engineering; analysis framework; code tracing; dependence analysis; reverse engineering;

fLanguage

English

Publisher

ieee

Conference_Titel

Source Code Analysis and Manipulation, 2009. SCAM '09. Ninth IEEE International Working Conference on

Conference_Location

Edmonton, AB

Print_ISBN

978-0-7695-3793-1

Type

conf

DOI

10.1109/SCAM.2009.1

Filename

5279880

Link To Document