DocumentCode
1690458
Title
The Temporal Development Of Electrical Breakdown In Laser Triggered GaAs-switches
Author
Schoenbach, K.H. ; Peterkin, F.E. ; Block, R.
Author_Institution
Old Dominion University
fYear
1994
Firstpage
192
Lastpage
192
Keywords
Breakdown voltage; Diode lasers; Electric breakdown; Electron devices; Electron traps; Gallium arsenide; Laser theory; Optical fiber testing; Optical modulation; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1994. Conference Record - Abstracts., 1994 IEEE International Conference on
Conference_Location
Santa Fe, NM, USA
ISSN
0730-9244
Print_ISBN
0-7803-2006-9
Type
conf
DOI
10.1109/PLASMA.1994.589056
Filename
589056
Link To Document