Emerging standards for manufacturing test of system-on-chip design

Author

Downey, David ; Lysaght, Patrick

Author_Institution

University of Strathclyde

fYear

1999

fDate

6/21/1905 12:00:00 AM

Firstpage

42644

Lastpage

42650

fLanguage

English

Publisher

iet

Conference_Titel

Systems on a Chip (Ref. No. 1999/133), IEE Colloquium on

Conference_Location

IET

Type

Filename

827244

Link To Document