DocumentCode :
1690772
Title :
Microwave measurements of the complex permittivity of construction materials using Fresnel reflection coefficients and reflection ellipsometry
Author :
Sagnard, F. ; Vignat, C. ; Montcourtois, V. ; Rolland, E.
Author_Institution :
Lab. Systemes de Commun., Univ. de Marne-La-Vallee, France
Volume :
1
fYear :
2001
Firstpage :
626
Abstract :
We compare two free-space reflection methods dedicated to the determination of the complex permittivity of materials at microwave frequencies. Original numerical methods, based on constant value lines charts and nonlinear least squares optimization, have been developed for each approach. Results are given in the case of homogeneous, single layer building slabs of finite and infinite thicknesses.
Keywords :
electromagnetic wave reflection; ellipsometry; microwave measurement; permittivity measurement; Fresnel reflection coefficients; complex permittivity; constant value lines charts; construction materials; finite thickness; free-space reflection methods; homogeneous slabs; infinite thickness; microwave measurements; nonlinear least squares optimization; reflection ellipsometry; single layer building slabs; Antenna measurements; Building materials; Ellipsometry; Fresnel reflection; Microwave measurements; Permittivity measurement; Polarization; Receiving antennas; Reflector antennas; Slabs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2001. IEEE
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7070-8
Type :
conf
DOI :
10.1109/APS.2001.958931
Filename :
958931
Link To Document :
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