Title :
Design of an efficient weighted random pattern generation system
Author :
Kapur, Rohit ; Patil, Srinivas ; Snethen, Thomas J. ; Williams, T.W.
Author_Institution :
IBM Corp. Microelectron, Endicott, NY, USA
Abstract :
This paper describes the design of an efficient weighted random pattern system. The performance of the system is measured by the number of weight sets and the number of weighted random patterns required for high fault coverage. Various heuristics that affect the performance of the system are discussed and an experimental evaluation is provided
Keywords :
VLSI; automatic test equipment; integrated logic circuits; logic testing; random processes; CMOS; VLSI; burn-out protection; efficient weighted random pattern generation; fault coverage; fault list re-ordering; heuristics; sampling; sorting; weight sets; weighted random patterns; Automatic control; Automatic testing; Circuit faults; Circuit testing; Circuit topology; Electrical fault detection; Fault detection; Linear feedback shift registers; Signal generators; Test pattern generators;
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-2103-0
DOI :
10.1109/TEST.1994.527991
