Title :
Quantitative modelling of resonant PL in InGaN SQW-LED structure
Author :
Sabathil, Matthias ; Laubsch, A. ; Linder, N.
Author_Institution :
OSRAM Opto Semicond., Regensburg
Abstract :
The measurement of bias and temperature dependent photoluminescence, photocurrent and their decay times allows to deduce important physical properties such as barrier height, electron-hole overlap and the magnitude of the piezoelectric field in InGaN quantum wells. However the analysis of these experiments demands for a detailed physical model based on a realistic device structure which is able to predict the measured quantities. In this work a self-consistent model is presented based on a realistic description of the alloy and doping profile of a green InGaN single quantum well light emitting diode. The model succeeds in the quantitative prediction of the quantum confined Stark shift and the associated change in the electron-hole overlap measured via the change in the bimolecular decay rate using literature parameters for the piezoelectric constants. The blue shift of the emission under forward current conditions can be attributed to the carrier induced screening of the piezoelectric charges as predicted by the model.
Keywords :
III-V semiconductors; gallium compounds; indium compounds; light emitting diodes; photoluminescence; piezoelectricity; quantum confined Stark effect; quantum well devices; semiconductor device models; spectral line shift; wide band gap semiconductors; InGaN; InGaN - Interface; SQW-LED structure; Stark shift; bimolecular decay rate; blue shift; carrier induced screening; doping profile; electron-hole overlap; piezoelectric charges; piezoelectric constant; resonant photoluminescence; single quantum well light emitting diode; Carrier confinement; Doping profiles; Light emitting diodes; Photoconductivity; Photoluminescence; Potential well; Predictive models; Resonance; Semiconductor process modeling; Temperature dependence;
Conference_Titel :
Numerical Simulation of Optoelectronic Devices, 2007. NUSOD '07. International Conference on
Conference_Location :
Newark, DE
Print_ISBN :
978-1-4244-1431-4
DOI :
10.1109/NUSOD.2007.4349004