• DocumentCode
    1691367
  • Title

    Using remote update controller of FPGA´s as built-in self test for embedded systems

  • Author

    Stoerte, C.

  • Author_Institution
    Astro Strobel, Bergisch Gladbach, Germany
  • fYear
    2013
  • Firstpage
    500
  • Lastpage
    501
  • Abstract
    This paper is an approach of a reliable built-in self test (BIST) on FPGA based embedded systems (e.g. digital TV receivers, compact head-ends, etc.), which could easily be executed by consumers. The proposed technology is quite similar to boundary scan testing via JTAG-Interface, which is a well-established method during production to find hardware errors on a circuit design at an early stage during the manufacturing process. In contrast to boundary scan the BIST is implemented as a part of factory image in state of the art FPGA´s and could be activated by graphical user interface. Since the factory image part of the firmware will never be updated by consumers, the BIST is always available even if a previous application firmware update has been failed. This offers a comfortable customer service, because in case of any support questions hardware errors could be excluded before complex assistance for configurations and firmware updates begins.
  • Keywords
    built-in self test; control engineering computing; electronic engineering computing; embedded systems; field programmable gate arrays; firmware; graphical user interfaces; integrated circuit reliability; logic design; logic testing; telecontrol; BIST; FPGA based embedded systems; JTAG-interface; boundary scan testing; built-in self test; circuit design; comfortable customer service; consumers; factory image; firmware update; graphical user interface; hardware errors; manufacturing process; remote update controller; Built-in self-test; Circuit faults; Embedded systems; Field programmable gate arrays; Hardware; Microprogramming; Production facilities; Embedded System; Remote Update; Self Test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics (ICCE), 2013 IEEE International Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    2158-3994
  • Print_ISBN
    978-1-4673-1361-2
  • Type

    conf

  • DOI
    10.1109/ICCE.2013.6486994
  • Filename
    6486994