Title :
Evaluation of 1.2kV Super Junction trench-gate clustered insulated gate bipolar transistor (SJ-TCIGBT)
Author :
Luther-King, N. ; Sweet, M. ; Narayanan, E. M Sankara
Author_Institution :
Electr. Machines & Drives Res. Group, Univ. of Sheffield, Sheffield, UK
Abstract :
We report, for the first time, results of extensive 2D simulation evaluation of the first MOS controlled thyristor structure employing the Super Junction concept on a 1.2 kV field stop structure. In comparison to a standard device, simultaneous reduction in Vce(sat) and Eoff can be achieved in a Super Junction Trench Clustered Insulated Gate Bipolar Transistor (SJ-TCIGBT). The simulation results show that up to 80% reduction in Eoff is possible. Unlike the Super Junction Insulated Gate Bipolar Transistors, there is no significant increase in the saturation current with the anode voltage or the depth of the pillars. SJ-TCIGBT is a highly promising next generation device concept with record-breaking Vce(sat) - Eoff trade-off enhancement to improve converter efficiency.
Keywords :
MOS-controlled thyristors; insulated gate bipolar transistors; 2D simulation evaluation; MOS controlled thyristor structure; converter efficiency; saturation current; super junction trench-gate clustered insulated gate bipolar transistor; voltage 1.2 kV; Anodes; Cathodes; Doping; Insulated gate bipolar transistors; Junctions; Logic gates; Performance evaluation;
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2011 IEEE 23rd International Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-8425-6
DOI :
10.1109/ISPSD.2011.5890798