• DocumentCode
    1691737
  • Title

    Evaluation of 1.2kV Super Junction trench-gate clustered insulated gate bipolar transistor (SJ-TCIGBT)

  • Author

    Luther-King, N. ; Sweet, M. ; Narayanan, E. M Sankara

  • Author_Institution
    Electr. Machines & Drives Res. Group, Univ. of Sheffield, Sheffield, UK
  • fYear
    2011
  • Firstpage
    92
  • Lastpage
    95
  • Abstract
    We report, for the first time, results of extensive 2D simulation evaluation of the first MOS controlled thyristor structure employing the Super Junction concept on a 1.2 kV field stop structure. In comparison to a standard device, simultaneous reduction in Vce(sat) and Eoff can be achieved in a Super Junction Trench Clustered Insulated Gate Bipolar Transistor (SJ-TCIGBT). The simulation results show that up to 80% reduction in Eoff is possible. Unlike the Super Junction Insulated Gate Bipolar Transistors, there is no significant increase in the saturation current with the anode voltage or the depth of the pillars. SJ-TCIGBT is a highly promising next generation device concept with record-breaking Vce(sat) - Eoff trade-off enhancement to improve converter efficiency.
  • Keywords
    MOS-controlled thyristors; insulated gate bipolar transistors; 2D simulation evaluation; MOS controlled thyristor structure; converter efficiency; saturation current; super junction trench-gate clustered insulated gate bipolar transistor; voltage 1.2 kV; Anodes; Cathodes; Doping; Insulated gate bipolar transistors; Junctions; Logic gates; Performance evaluation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs (ISPSD), 2011 IEEE 23rd International Symposium on
  • Conference_Location
    San Diego, CA
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4244-8425-6
  • Type

    conf

  • DOI
    10.1109/ISPSD.2011.5890798
  • Filename
    5890798