Title :
Large-Signal Modeling on Device Level: Intermodulation Distortion and Eye-Diagrams of Semiconductor Lasers
Author :
Odermatt, Stefan ; Witzigmann, Bernd ; Schmithüsen, Bernhard
Author_Institution :
Synopsys Switzerland LLC, Zurich
Abstract :
Large-signal modulation characteristics such as intermodulation distortion and eye-diagrams are key specifications in analog and digital applications of optoelectronic devices. In this work, a novel framework based on a multi-dimensional time-domain/frequency-domain multi-tone harmonic balance method is presented to model these characteristics for semiconductor lasers on device level. After a short introduction of the multi-tone harmonic balance method, the large-signal modulation characteristics of an AlGaAs/GaAs-based vertical-cavity surface- emitting laser are analyzed using a two-dimensional electro-opto-thermal simulation setup. The simulations reveal the relationship between the bias conditions, active region carrier dynamics and the large-signal characteristics.
Keywords :
III-V semiconductors; aluminium compounds; electro-optical devices; frequency-domain analysis; gallium arsenide; harmonic analysis; intermodulation distortion; semiconductor device models; semiconductor lasers; surface emitting lasers; thermo-optical devices; time-domain analysis; AlGaAs-GaAs; AlGaAs-GaAs - Interface; active region carrier dynamics; eye-diagrams; intermodulation distortion; large-signal modulation characteristics; multidimensional time-domain/frequency-domain method; multitone harmonic balance method; optoelectronic devices; semiconductor lasers; two-dimensional electro-opto-thermal simulation; vertical-cavity surface- emitting laser; Digital modulation; Frequency domain analysis; Intermodulation distortion; Laser modes; Laser noise; Optoelectronic devices; Semiconductor lasers; Surface emitting lasers; Time domain analysis; Vertical cavity surface emitting lasers;
Conference_Titel :
Numerical Simulation of Optoelectronic Devices, 2007. NUSOD '07. International Conference on
Conference_Location :
Newark, DE
Print_ISBN :
978-1-4244-1431-4
DOI :
10.1109/NUSOD.2007.4349027