DocumentCode :
1691904
Title :
Research on the automatic visual inspection model based on extenics
Author :
Ding, F.-H. ; Lin, M.-X. ; De Wu ; Li, D.-W.
Author_Institution :
Key Lab. of High Efficiency & Clean Mech. Manuf., Shandong Univ., Jinan, China
fYear :
2010
Firstpage :
6037
Lastpage :
6041
Abstract :
This paper puts forward five-layer extension AVI model (EAVI) by combining the extension knowledge and automatic visual inspection(AVI)area knowledge. Then gives the detailed analysis process of the image acquisition layer and pre-processing layer according to the four extension thinking modes, and designs the AVI model evaluating methods. Describing and analyzing the AVI process using the methods provided by Extenics will be helpful to the research on the intelligence, generality, and the reconfigurability of the AVI system.
Keywords :
computer vision; data acquisition; AVI; Extenics; automatic visual inspection model; image acquisition layer; Artificial intelligence; Inspection; Silicon; Silicon compounds; Solid modeling; Video recording; Visualization; automatic visiual inspection; extenics; extension assessment; five-layer model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Control and Automation (WCICA), 2010 8th World Congress on
Conference_Location :
Jinan
Print_ISBN :
978-1-4244-6712-9
Type :
conf
DOI :
10.1109/WCICA.2010.5554614
Filename :
5554614
Link To Document :
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