• DocumentCode
    169200
  • Title

    A new lot sentencing method by variables inspection

  • Author

    Yen-Wen Chen ; Chien-Wei Wu

  • Author_Institution
    Dept. of Ind. Eng. & Eng. Manage., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2014
  • fDate
    21-23 May 2014
  • Firstpage
    380
  • Lastpage
    383
  • Abstract
    Acceptance sampling plans have been one of practical tools for quality control applications, and several acceptance sampling plans were developed for different purposes. In particular, the concept of multiple dependent state (MDS) sampling plan was developed, in which the lot disposition is not only based on the current sample from the lot, but also on sample results from past lots. This paper attempts to develop a variables MDS sampling plan for normally distributed processes with two-sided specification limits. The performance of the proposed plan is examined and compared with the existing variables single sampling plan.
  • Keywords
    inspection; lot sizing; normal distribution; production planning; quality control; sampling methods; MDS sampling plan; acceptance sampling plans; lot sentencing method; multiple dependent state; normal distribution; quality control; variables inspection; Gaussian distribution; Indexes; Industrial engineering; Inspection; Production; Quality control; Standards; Multiple dependent state sampling plan; operating characteristic curve; process capability index; process yield;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Supported Cooperative Work in Design (CSCWD), Proceedings of the 2014 IEEE 18th International Conference on
  • Conference_Location
    Hsinchu
  • Type

    conf

  • DOI
    10.1109/CSCWD.2014.6846874
  • Filename
    6846874