Title :
A new lot sentencing method by variables inspection
Author :
Yen-Wen Chen ; Chien-Wei Wu
Author_Institution :
Dept. of Ind. Eng. & Eng. Manage., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
Acceptance sampling plans have been one of practical tools for quality control applications, and several acceptance sampling plans were developed for different purposes. In particular, the concept of multiple dependent state (MDS) sampling plan was developed, in which the lot disposition is not only based on the current sample from the lot, but also on sample results from past lots. This paper attempts to develop a variables MDS sampling plan for normally distributed processes with two-sided specification limits. The performance of the proposed plan is examined and compared with the existing variables single sampling plan.
Keywords :
inspection; lot sizing; normal distribution; production planning; quality control; sampling methods; MDS sampling plan; acceptance sampling plans; lot sentencing method; multiple dependent state; normal distribution; quality control; variables inspection; Gaussian distribution; Indexes; Industrial engineering; Inspection; Production; Quality control; Standards; Multiple dependent state sampling plan; operating characteristic curve; process capability index; process yield;
Conference_Titel :
Computer Supported Cooperative Work in Design (CSCWD), Proceedings of the 2014 IEEE 18th International Conference on
Conference_Location :
Hsinchu
DOI :
10.1109/CSCWD.2014.6846874