• DocumentCode
    1692008
  • Title

    DCB substrates: solution for high temperature applications

  • Author

    Schulz-Harder, Juergen

  • Author_Institution
    Curamik Electron. GmbH, Eschenbach, Germany
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    65
  • Abstract
    Summary form only given. DBC (Direct Bonded Copper) substrates have been proved over many years to be the most cost effective and reliable solution for circuits in power electronics. The bases of these substrates are ceramics, either alumina or aluminium nitride. The metallisation consists of copper layers bonded to ceramic at high temperature. DBC differs from thick film metallisation in that the copper layers consist of pure metal with high electric conductivity whereas the DBC process is carried out at temperatures above 1065°C; the working temperature of DBC substrates can be up to 900°C. DBC substrates are successfully brazed to covar at temperatures of 850°C to 900°C without affecting their functionality. At temperatures above 500°C in hydrogen atmosphere the copper/ceramic interface peel strength is reduced. The copper surface of DBC substrates can be protected against oxidation by plating (Ni+Au) as a standard process. The range thickness of DCB is between 0.2 and 0.7 mm. Standard thicknesses are 0.2 mm and 0.3 mm. The reliability of DBC substrate temperature cycling is dependent on the absolute temperature and the temperature range. For military and automotive specifications the reliability could be improved by reducing the copper thickness at the copper edges by a simple low cost etching process
  • Keywords
    copper; high-temperature electronics; metallisation; power electronics; printed circuit manufacture; substrates; 0.2 to 0.7 mm; 850 to 900 C; Cu; DCB substrates; absolute temperature; automotive specifications; ceramic bonded layers; direct bonded copper; high temperature electronics; interface peel strength; low cost etching process; metallisation; military specifications; oxidation protection; power electronics; reliability; temperature cycling; Bonding; Ceramics; Circuits; Copper; Costs; Metallization; Power electronics; Substrates; Temperature dependence; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Temperature Electronics, 1999. HITEN 99. The Third European Conference on
  • Conference_Location
    Berlin
  • Print_ISBN
    0-7803-5795-7
  • Type

    conf

  • DOI
    10.1109/HITEN.1999.827465
  • Filename
    827465