Title :
A 0.67nJ/S time-domain temperature sensor for low power on-chip thermal management
Author :
Young-Jae An ; Kyungho Ryu ; Dong Hoon Jung ; Seung-Han Woo ; Seong-Ook Jung
Author_Institution :
VLSI Syst. Lab., Yonsei Univ., Seoul, South Korea
Abstract :
This paper presents a time-domain temperature sensor with process variation tolerance for low power on-chip thermal management. To achieve a suitable on-chip composition, the proposed sensor uses the externally applied code to save the area- and power-consumption. The proposed sensor is implemented using a 0.13μm CMOS process technology and its core area is 0.031mm2. The measurement results show that the energy per conversion rate is 0.67nJ/S at 1.2V supply voltage, conversion rate is 430k samples/sec, and sensing error is -0.63 ~ +1.04°C with 2nd order master curve and one-point calibration over the temperature range of 20 ~ 120°C.
Keywords :
CMOS integrated circuits; calibration; low-power electronics; temperature sensors; thermal management (packaging); time-domain analysis; tolerance analysis; CMOS process technology; low power on-chip thermal management; on-chip composition; one-point calibration; power consumption; power saving; process variation tolerance; second order master curve; sensing error; size 0.13 mum; temperature 20 degC to 120 degC; time-domain temperature sensor; voltage 1.2 V; Calibration; Semiconductor device measurement; System-on-chip; Temperature measurement; Temperature sensors;
Conference_Titel :
Consumer Electronics (ICCE), 2013 IEEE International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4673-1361-2
DOI :
10.1109/ICCE.2013.6487022