DocumentCode
1692172
Title
Detection and correction of systematic type I test errors through concurrent engineering
Author
Kosar, William R.
Author_Institution
Philips Semiconds., Albuquerque, NM, USA
fYear
34608
Firstpage
531
Lastpage
538
Abstract
Systematic Type I test errors in the integrated circuit production test environment are analyzed with an emphasis on wafer level test problems. Effective use of concurrent engineering procedures is shown to be a critical factor in the rapid detection and solution of these problems
Keywords
concurrent engineering; error correction; error detection; integrated circuit testing; production testing; EPROM; UPROM; concurrent engineering; error correction; error detection; integrated circuit production test; systematic type I test errors; wafer level test; Capacitance; Circuit testing; Concurrent engineering; Costs; Design engineering; Error correction; History; Integrated circuit testing; Materials testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1994. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2103-0
Type
conf
DOI
10.1109/TEST.1994.527996
Filename
527996
Link To Document