• DocumentCode
    1692174
  • Title

    Interconnections constrained by convention

  • Author

    Chilton, A.C.

  • Author_Institution
    NEMeC Ltd., North Shield, UK
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    111
  • Lastpage
    115
  • Abstract
    Interconnecting components for high temperature electronic circuits by conventional solders has meant that alloys have had to be selected that melt at even higher temperatures than the operating temperature of the circuit. Further, to get these solder alloys to be sufficiently fluid the process temperature has to be considerably greater than the simple melting temperature. Thus the components must be considerably stressed simply to make the interconnections. This will impact on circuit reliability or simply these high temperatures will destroy the component. The author outlines an approach which, far from eutectic soldering, allows processing temperatures to be reduced and the solder joint to continue to develop as the circuit is operating at high temperatures. Indeed the melting temperature of the alloy should increase with exposure to high temperatures. This may lead to difficulties of reworking the joints but this could be overcome by flooding the joint with the low melting phase
  • Keywords
    circuit reliability; copper alloys; high-temperature electronics; interconnections; reflow soldering; silver alloys; tin alloys; 125 C; 300 C; Cu/Sn/Ag system; CuSnAg; circuit operating temperature; circuit reliability; component interconnection; high temperature electronic circuits; joint reworking; low melting phase; melting temperature; processing temperatures; reflow temperature; solder joint; Assembly; Copper alloys; Creep; Fatigue; Lead; Soldering; Strain measurement; Surface-mount technology; Temperature; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Temperature Electronics, 1999. HITEN 99. The Third European Conference on
  • Conference_Location
    Berlin
  • Print_ISBN
    0-7803-5795-7
  • Type

    conf

  • DOI
    10.1109/HITEN.1999.827475
  • Filename
    827475