Title :
Carrier envelope phase effects in strong field ionization of xenon with few-cycle 1.8μm laser pulses
Author :
Schmidt, Bruno E. ; Möller, Max ; Sayler, A. Max ; Shiner, Andrew D. ; Vampa, Giulio ; Kieffer, J. -C ; Légaré, François ; Villeneuve, David M. ; Paulus, G.G. ; Corkum, Paul B.
Author_Institution :
Inst. Nat. de la Rech. Sci. Centre Energie Mater. et Telecommun., Varennes, QC, Canada
Abstract :
Stereo above threshold ionization in xenon was studied with CEP stable few-cycle IR laser pulses. Strong CEP dependence was revealed both for directly ionized and rescattered electrons for pulse durations from 2 to 5 cycles.
Keywords :
atom-photon collisions; field ionisation; xenon; CEP stable few cycle IR laser pulses; Xe; carrier envelope phase effects; directly ionized electrons; rescattered electrons; stereo above threshold ionization; strong field ionization; xenon; Ionization; Laser theory; Measurement by laser beam; Optical amplifiers; Optical fiber sensors; Optical fibers;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
