Title :
Laser-induced, plasma-based, non-contact electrical testing of functional hardware
Author :
Millard, Don ; Block, Robert ; Umstader, Karl
Author_Institution :
Center for Manuf. Productivity & Technol. Transfer, Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
In order to non-destructively test fine-pitch devices, a system has been developed that uses a laser-induced plasma to provide the conduction between an electronic component and monitoring equipment. This non-contact system has been shown to produce a 10-20-μs non-loading electrical pathway that can transmit both DC and high-frequency signals to or from a printed wiring board. The non-contact electrical pathway is first expected to be used for probing and observation of electronic equipment
Keywords :
nondestructive testing; plasma applications; plasma production and heating by laser beam; printed circuit testing; DC signals; NDT; fine-pitch devices; functional hardware; high-frequency signals; laser-induced plasma; noncontact electrical testing; plasma photoionisation; printed wiring board; Circuit testing; Contacts; Electronic equipment testing; Hardware; Integrated circuit interconnections; Multichip modules; Plasma applications; Plasma devices; Plasma measurements; Wiring;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1991., Eleventh IEEE/CHMT International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-0155-2
DOI :
10.1109/IEMT.1991.279780
