DocumentCode :
1692442
Title :
Techniques to prevent substrate injection induced failure during ESD events in automotive applications
Author :
Gendron, Amaury ; Gill, Chai ; Aykroyd, Craig ; Zhan, Carol
Author_Institution :
Freescale Semicond., Tempe, AZ, USA
fYear :
2011
Firstpage :
192
Lastpage :
195
Abstract :
This paper presents several techniques to improve ESD robustness for high voltage IO designs in automotive applications. SCR-based ESD clamps designed on isolated wells can generate high level of substrate injection during ESD events, causing false triggering and irreversible failures of internal components. To mitigate substrate injection effects, we have defined design strategies leading to a set of designs rules for proper integration with ESD clamps.
Keywords :
automotive electronics; electrostatic discharge; failure analysis; thyristors; ESD robustness; SCR-based ESD clamps; automotive applications; high-voltage IO designs; substrate injection-induced failure; Anodes; Clamps; Electrostatic discharge; Junctions; Robustness; Substrates; Thyristors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2011 IEEE 23rd International Symposium on
Conference_Location :
San Diego, CA
ISSN :
1943-653X
Print_ISBN :
978-1-4244-8425-6
Type :
conf
DOI :
10.1109/ISPSD.2011.5890823
Filename :
5890823
Link To Document :
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