• DocumentCode
    1692635
  • Title

    Multi-chip-module substrate decreasing signal delay and improving thermal conductivity

  • Author

    Kuramochi, T. ; Kiyokawa, H. ; Ono, Takahito ; Miyasaka, K.

  • Author_Institution
    Fujitsu Ltd., Kawasaki, Japan
  • fYear
    1991
  • Firstpage
    255
  • Lastpage
    261
  • Abstract
    An MCM (multi-chip-module) substrate which has less parasitic capacitance and less thermal stress displacement than the conventional type of substrate has been developed. A low-ε fluorocarbon resin for interlayer insulator underneath the multi-wiring layers in the substrate on which LSI chips should be mounted was used. The remaining portion of the substrate was filled with insulating material which has high thermal conductivity and low expansion coefficient, e.g., polyimide resin or silicone resin mixed with boron nitride, alumina, silicon carbide, and/or silica. As a result, one could improve the signal delay and characteristic impedance by 30~40%, decrease the thermal stress displacement 0.22~0.39 times, and improve the thermal conductivity 1.5~1.8 times, compared with existing technology using polyimide only
  • Keywords
    hybrid integrated circuits; modules; substrates; thermal stresses; wiring; Al2O3; BN; LSI chips; MCM; SiC; SiO2; characteristic impedance; expansion coefficient; fluorocarbon resin; interlayer insulator; multi-chip-module; multi-wiring layers; parasitic capacitance; polyimide resin; signal delay; silicone resin; thermal conductivity; thermal stress displacement; Conducting materials; Delay; Insulation; Large scale integration; Parasitic capacitance; Polyimides; Resins; Thermal conductivity; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1991., Eleventh IEEE/CHMT International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-7803-0155-2
  • Type

    conf

  • DOI
    10.1109/IEMT.1991.279790
  • Filename
    279790