• DocumentCode
    1692938
  • Title

    Utilization analysis of trim-enabled NAND flash memory

  • Author

    Boncheol Gu ; Jupyung Lee ; Jung, B.M. ; Jungmin Seo ; Hyun-Jung Shin

  • Author_Institution
    Samsung Adv. Inst. of Technol., Yongin, South Korea
  • fYear
    2013
  • Firstpage
    645
  • Lastpage
    646
  • Abstract
    In this paper, we present a novel probabilistic model of the utilization for trim-enabled NAND flash memory devices. This model provides a simple and powerful method to reason about the performance of NAND flash memory, given its capacity and the frequency of write operations.
  • Keywords
    NAND circuits; flash memories; probability; probabilistic model; trim-enabled NAND flash memory device utilization analysis; Analytical models; Conferences; Consumer electronics; File systems; Flash memories; Performance evaluation; Steady-state;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics (ICCE), 2013 IEEE International Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    2158-3994
  • Print_ISBN
    978-1-4673-1361-2
  • Type

    conf

  • DOI
    10.1109/ICCE.2013.6487053
  • Filename
    6487053
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1692938