• DocumentCode
    1693023
  • Title

    Static Estimation of Test Coverage

  • Author

    Alves, Tiago L. ; Visser, Joost

  • Author_Institution
    Univ. do Minho, Minho, Portugal
  • fYear
    2009
  • Firstpage
    55
  • Lastpage
    64
  • Abstract
    Test coverage is an important indicator for unit test quality. Tools such as Clover compute coverage by first instrumenting the code with logging functionality, and then logging which parts are executed during unit test runs. Since computation of test coverage is a dynamic analysis, it presupposes a working installation of the software. In the context of software quality assessment by an independent third party, a working installation is often not available. The evaluator may not have access to the required libraries or hardware platform. The installation procedure may not be automated or documented. In this paper, we propose a technique for estimating test coverage at method level through static analysis only. The technique uses slicing of static call graphs to estimate the dynamic test coverage. We explain the technique and its implementation. We validate the results of the static estimation by statistical comparison to values obtained through dynamic analysis using Clover. We found high correlation between static coverage estimation and real coverage at system level but closer analysis on package and class level reveals opportunities for further improvement.
  • Keywords
    data flow analysis; graph theory; program slicing; program testing; software quality; Clover tool; data flow analysis; dynamic test coverage static estimation; program dynamic analysis; program slicing; program static analysis; software quality assessment; static call graph; Application software; Hardware; Instruments; Java; Monitoring; Packaging; Programming; Software libraries; Software quality; Software testing; estimation; metrics; slicing; static analysis; test coverage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Source Code Analysis and Manipulation, 2009. SCAM '09. Ninth IEEE International Working Conference on
  • Conference_Location
    Edmonton, AB
  • Print_ISBN
    978-0-7695-3793-1
  • Type

    conf

  • DOI
    10.1109/SCAM.2009.15
  • Filename
    5279992