• DocumentCode
    1693162
  • Title

    Generic, Direct-Chip-Attach MEMS packaging design with high density and aspect ratio Through-Wafer Electrical Interconnect

  • Author

    Ok, Seong Joon ; Neysmith, Jordan ; Baldwin, Daniel F.

  • Author_Institution
    Adv. Assembly Process Technol. Lab., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    232
  • Lastpage
    237
  • Abstract
    Micro-Electro-Mechanical-Systems (MEMS) are integrated systems combining electrical and mechanical components, which are fabricated using integrated circuit (IC) batch processing techniques. The influence of MEMS is made possible through their benefits in functionality, size, and reliability. In spite of these remarkable and promising achievements in the field of microsystem fabrication, the commercialization of proven devices are lagged far behind expectations, considerably due to high packaging cost, improper packaging design solution and high testing cost. This paper is focused on suggesting and demonstrating a promising generic, modular, Direct-Chip-Attach (DCA), low cost and high reliable MEMS packaging design strategy and solution applying with high aspect ratio Through-Wafer Electrical Interconnect (TWEI). Fabrication of TWEI using dry etching is relatively new technology that can create more and better packaging options than any other conventional packaging design. The various techniques that can make through-wafer vias conductive are demonstrated and analyzed with advantages and drawbacks.
  • Keywords
    chip scale packaging; electroplating; integrated circuit interconnections; integrated circuit manufacture; micromachining; micromechanical devices; photolithography; IC packaging; ICP etching; LPCVD; MEMS packaging; direct-chip-attach packaging; electroplating; hermeticity; integrated circuit batch processing; pattering; photolithography; reliability; solder bumps; thick photoresist; Bonding; Costs; Dry etching; Electronic packaging thermal management; Electronics packaging; Insulation; Integrated circuit interconnections; Integrated circuit technology; Micromechanical devices; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2002. Proceedings. 52nd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7430-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2002.1008099
  • Filename
    1008099