DocumentCode :
169327
Title :
DiagBridge: Analyzing scan diagnosis data in a yield perspective
Author :
Yan Pan ; Chittora, Anshu ; Sekar, K. ; Malik, S. ; Keat, Lim Seng
Author_Institution :
GLOBALFOUNDRIES Inc., Malta, NY, USA
fYear :
2014
fDate :
19-21 May 2014
Firstpage :
15
Lastpage :
20
Abstract :
In this work, we described a powerful volume diagnosis and yield analysis framework called DiagBridge. DiagBridge enhances volume diagnosis results with sort and design data so as to present the volume diagnosis results in easy-to-understand metrics like yield loss estimation and failure rate estimation. We are already sharing these results with cross-functional teams and seeing various functional teams taking corrective actions to improve yield and reduce yield-limiting factors. Such systems further enables straight-forward comparisons and significantly improves the efficiency in logic yield ramping.
Keywords :
failure analysis; integrated circuit yield; logic circuits; logic testing; DiagBridge; failure rate estimation; logic yield ramping; scan diagnosis data; volume diagnosis; yield analysis framework; yield loss estimation; Computer architecture; Estimation; Failure analysis; Measurement; Sociology; Standards; Statistics; failure analysis; scan diagnosis; volume diagnosis; yield loss pareto; yield ramp;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference (ASMC), 2014 25th Annual SEMI
Conference_Location :
Saratoga Springs, NY
Type :
conf
DOI :
10.1109/ASMC.2014.6846948
Filename :
6846948
Link To Document :
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