DocumentCode :
1693305
Title :
In-line ozone cleaning for plated ceramic substrates
Author :
Remy, Marie-Josee
Author_Institution :
Microelectron. Div., IBM Canada Ltd., Que., Canada
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
263
Lastpage :
267
Abstract :
Oxygen plasma ashing is commonly used to remove organic residues from surfaces, such as alumina substrates, after the plating process. An innovative cleaning method was developed in order to replace the oxygen plasma batch process by a continuous, in-line, process using ozone as the reactive gas. This paper describes the development and qualification of the ozone ashing process. Feasibility experiments and equipment design are briefly presented. Process parameters considered in the Design of Experiments and chosen methods to evaluate the efficiency of the process, along with results, are discussed. Qualification requirements as well as functional and reliability test results are also reviewed. An integrated approach was used throughout this project, taking into account possible substrate-assembly interactions while considering the need for evaluation methods representative of the actual manufacturing process. A discussion of this approach concludes the paper.
Keywords :
alumina; design of experiments; integrated circuit manufacture; integrated circuit testing; ozone; substrates; surface cleaning; Al2O3; O3; alumina substrates; bond assembly; design of experiments; in-line ozone cleaning; in-line process; organic stain removal; plated ceramic substrates; plating; reliability; substrate finishing; substrate plating line; Ceramics; Cleaning; Gold; Microelectronics; Plasma applications; Plasma chemistry; Plasma temperature; Substrates; Surface contamination; Surface finishing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN :
0569-5503
Print_ISBN :
0-7803-7430-4
Type :
conf
DOI :
10.1109/ECTC.2002.1008105
Filename :
1008105
Link To Document :
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