Title :
An integrated approach to process monitoring and data analysis
Author :
Wong, K.Y. ; Daudenarde, J.J. ; Yeh, C.S. ; Cheung, I. ; Ruble, E. ; Rabier, G.
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
Abstract :
The authors describe two architectures: the Automated Process Monitoring (APROM) System, which examines a large combination of trend charts and shows the symptoms of problems to the engineers by sending a high level message and a chart when a process variable is out of control; and the Interactive Data Extraction and Analysis (IDEA) System, which provides a simple menu interface to get a block of data from a local, or remote host database. Once the user receives the right data block, the user can interactively exercise many options of plots and statistical data analysis functions. An application is described by a profile which can be modified easily by users
Keywords :
computerised monitoring; quality control; statistical analysis; statistical process control; APROM; Automated Process Monitoring; Interactive Data Extraction and Analysis; data analysis; data block; menu interface; process monitoring; process variable; statistical analysis; trend charts; Automatic control; Computerized monitoring; Control charts; Control systems; Data analysis; Data mining; Databases; Magnetic heads; Manufacturing processes; Process control;
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1991., Eleventh IEEE/CHMT International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-0155-2
DOI :
10.1109/IEMT.1991.279822
