Is IDDQ yield loss inevitable?

I_DDQ testing is a powerful way to improve the quality of low fault coverage tests, and to detect defects that are hard or impossible to detect using traditional voltage testing methods. However, it appears that there is some yield loss associated with I_DDQ testing, where yield loss means that devices passing burn-in and system tests fail I_DDQ test. This paper gives reasons why such yield loss is inevitable, and must be considered when making a decision whether or not to use I_DDQ testing. We also present some evidence backing up this speculation, and a brief economic model to help in making I_DDQ testing decisions