DocumentCode :
1693637
Title :
Reusing Component Test Cases for Integration Testing of Retarding Embedded System Components
Author :
Pérez, Abel Marrero ; Kaiser, Stefan
Author_Institution :
Daimler Center for Automotive IT Innovations, Tech. Univ. Berlin, Berlin, Germany
fYear :
2009
Firstpage :
1
Lastpage :
6
Abstract :
The integration of retarding components represents a crucial challenge for reusing component test cases for integration testing. Failing to synchronize both test stimulation and test evaluation easily results in useless test executions missing the actual test objectives. We propose a method for balancing and compensating delays for multi-level test cases. With this approach, reusing component test cases for integration testing becomes possible even in presence of components introducing large delays. It represents a better alternative to test case parameterization.
Keywords :
embedded systems; object-oriented programming; program testing; software reusability; component test case reusage; delay balancing; delay compensation; embedded system component integration testing; Automatic control; Automatic testing; Automotive engineering; Delay; Electronic equipment testing; Embedded software; Embedded system; Life testing; Software testing; System testing; Embedded Systems; Test Case Reuse; Test Event Synchronization; Test Levels;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advances in System Testing and Validation Lifecycle, 2009. VALID '09. First International Conference on
Conference_Location :
Porto
Print_ISBN :
978-1-4244-4862-3
Electronic_ISBN :
978-0-7695-3774-0
Type :
conf
DOI :
10.1109/VALID.2009.19
Filename :
5280015
Link To Document :
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