DocumentCode :
1693737
Title :
Chip scale package for SAW filter on the oxidized porous silicon using flip-chip bonding and Cu plated metal wall
Author :
Ha, Man-Lyun ; Lee, Jong-Soo ; Kwon, Young-Se
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Daejon, South Korea
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
372
Lastpage :
377
Abstract :
Chip scale package (CSP) for surface acoustic wave (SAW) filter has been implemented on silicon with thick oxidized porous silicon (OPS) layer using the thick plated metal wall and flip-chip bonding technique and the RF performance of SAW filter was measured. The key approach of this article was that the SAW filter and semiconductor RFICs were packaged on same substrate (OPS) with same packaging method (epoxy molding) at the same time. In packaging the SAW filter, the surface should be maintained in hermetic void for the performance reliability, and this has been solved by metal wall and epoxy molding compound. The silicon with thick OPS layer had good RF performance. The transmission line loss was below 0.1 dB/mm in L-band. flip-chip bonded SAW filter on OPS layer showed the -2.6 dB passband loss and 0.95 dB maximum ripple in 865-895 MHz range and the stopband attenuation was below -50 dB. For the demonstration of CSP SAW filter, we have developed the dual mode (CDMA and AMPS) receiver module where the SAW filter was interconnected between low noise amplifier (LNA) and down mixer which was also assembled on OPS layer using multichip module technology.
Keywords :
UHF filters; chip scale packaging; code division multiple access; flip-chip devices; integrated circuit reliability; moulding; multichip modules; surface acoustic wave resonator filters; 865 to 895 MHz; AMPS; CDMA; CSP; L-band; LNA; RF performance; SAW filter; Si; chip scale package; epoxy molding; flip-chip bonding technique; hermetic void; multichip module technology; oxidized porous silicon; passband loss; performance reliability; thick plated metal wall; transmission line loss; Acoustic measurements; Acoustic waves; Bonding; Chip scale packaging; Propagation losses; Radio frequency; SAW filters; Semiconductor device packaging; Silicon; Surface acoustic waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN :
0569-5503
Print_ISBN :
0-7803-7430-4
Type :
conf
DOI :
10.1109/ECTC.2002.1008123
Filename :
1008123
Link To Document :
بازگشت